Tachizaki Takehiro

基本情報

Undergraduate School of Information Science and Technology / Department of Applied Computer Engineering
Undergraduate School of Engineering / Department of Optical and Imaging Science and Technology
Graduate School of Engineering / Course of Electrical and Electronic Engineering

Natural sciences Semiconductors, optical and atomic physics
Nanotechnology/Materials Optical engineering and photonics Optical Properties of Condensed Matters
Nanotechnology/Materials Optical engineering and photonics Optical Metrology
Nanotechnology/Materials Thin-film surfaces and interfaces Thin film, Surfaces and Interfaces
Nanotechnology/Materials Thin-film surfaces and interfaces Scanning Probe Microscopy

Paper Award Low-background tip-enhanced Raman spectroscopy enabled by a plasmon thin-film waveguide probe
R&D Magazine 2014 R&D100 Plasmon-Excitation Optical Scanning Probe Microscope (Optical SPM）
R&D Magazine 2011 R&D100 Picometer-Resolution Quantitative Metrology Atomic Force Microscope
Symposium on Ultrasonic Electronics Young Scientist Award
Course of Sustainable Resources Engineering, Hokkaido University Teacher of the year 2003

Terahertz pulse-altered gene networks in human induced pluripotent stem cells.

Nanometer-precise optical length measurement using near-field scanning optical microscopy with sharpened single carbon nanotube probe

Generation of broadband near-field optical spots using a thin-film silicon waveguide with gradually changing thickness

Acoustic whispering-gallery modes generated and dynamically imaged with ultrashort optical pulses

Scanning ultrafast Sagnac interferometry for imaging two-dimensional surface wave propagation

Defect detection method and defect detection device and defect observation device provided with same
Defect detection method and defect detection device and defect observation device provided with same
Scanning Probe Miscroscope
Scanning probe microscope and measurement method using same
Distance measuring device and distance measuring method
Defect detection method and defect detection device and defect observation device provided with same
Thermally assisted magnetic recording head inspection method and apparatus
Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus
Scanning probe microscope and surface shape measurement method using same
Thermally assisted magnetic recording head inspection method and apparatus

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